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ISSTA
2009
ACM
14 years 2 months ago
Precise pointer reasoning for dynamic test generation
Dynamic test generation consists of executing a program while gathering symbolic constraints on inputs from predicates encountered in branch statements, and of using a constraint ...
Bassem Elkarablieh, Patrice Godefroid, Michael Y. ...
KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 11 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
WWW
2007
ACM
14 years 8 months ago
A fault model and mutation testing of access control policies
To increase confidence in the correctness of specified policies, policy developers can conduct policy testing by supplying typical test inputs (requests) and subsequently checking...
Evan Martin, Tao Xie
SEKE
2010
Springer
13 years 6 months ago
Ontology-Based Test Case Generation For Simulating Complex Production Automation Systems
—The behavior of complex production automation systems is hard to predict, therefore simulation is used to study the likely system behavior. However, in a real-world system many ...
Thomas Moser, Gregor Dürr, Stefan Biffl
ICML
2006
IEEE
14 years 8 months ago
Feature value acquisition in testing: a sequential batch test algorithm
In medical diagnosis, doctors often have to order sets of medical tests in sequence in order to make an accurate diagnosis of patient diseases. While doing so they have to make a ...
Victor S. Sheng, Charles X. Ling