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» Using Static Analysis to Improve Automatic Test Generation
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ATS
2000
IEEE
145views Hardware» more  ATS 2000»
14 years 26 days ago
Compaction-based test generation using state and fault information
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
SAC
2004
ACM
14 years 1 months ago
WebUml: reverse engineering of web applications
Web applications have become complex and crucial for many firms, especially when combined with areas such as CRM (Customer Relationship Management) and BPR (Business Process Reen...
Carlo Bellettini, Alessandro Marchetto, Andrea Tre...
CIKM
2005
Springer
14 years 2 months ago
Generating better concept hierarchies using automatic document classification
This paper presents a hybrid concept hierarchy development technique for web returned documents retrieved by a meta-search engine. The aim of the technique is to separate the init...
Razvan Stefan Bot, Yi-fang Brook Wu, Xin Chen, Qua...
KBSE
2007
IEEE
14 years 2 months ago
Combined static and dynamic mutability analysis
Knowing which method parameters may be mutated during a method’s execution is useful for many software engineering tasks. We present an approach to discovering parameter referen...
Shay Artzi, Adam Kiezun, David Glasser, Michael D....
SIGSOFT
2007
ACM
14 years 9 months ago
The impact of input domain reduction on search-based test data generation
There has recently been a great deal of interest in search? based test data generation, with many local and global search algorithms being proposed. However, to date, there has be...
Mark Harman, Youssef Hassoun, Kiran Lakhotia, Phil...