In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
We consider a real-world problem arising in a warehouse for spare parts. Items ordered by customers shall be collected and for this purpose our task is to determine efficient picku...
Maintenance is the dominant source of downtime at high availability sites. Unfortunately, the dominant mechanism for reducing this downtime, cluster rolling upgrade, has two short...
We show how to combine a general purpose type system for an existing language with support for programming with binders and contexts by refining the type system of ML with a rest...
tion and Abstract Separation Logic Cristiano Calcagno Imperial College, London Peter W. O’Hearn Queen Mary, University of London Hongseok Yang Queen Mary, University of London S...
Cristiano Calcagno, Peter W. O'Hearn, Hongseok Yan...