In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
We investigate in this article the rigid registration of large sets of points, generally sampled from surfaces. We formulate this problem as a general Maximum-Likelihood (ML) estim...
The task of computing molecular structure from combinations of experimental and theoretical constraints is expensive because of the large number of estimated parameters (the 3D co...
Cheng Che Chen, Jaswinder Pal Singh, Russ B. Altma...
Congestion management is likely to become a critical issue in interconnection networks, as increasing power consumption and cost concerns will lead to the use of smaller networks....
d Abstract] Virginia Vassilevska School of Mathematics Institute for Advanced Study Princeton, NJ 08540 USA virgi@math.ias.edu Ryan Williams School of Mathematics Institute for Adv...