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IWANN
1995
Springer
13 years 11 months ago
Test Pattern Generation for Analog Circuits Using Neural Networks and Evolutive Algorithms
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
José Luis Bernier, Juan J. Merelo Guerv&oac...
SNPD
2003
13 years 9 months ago
An Industrial Experience in Comparing Manual vs. Automatic Test Cases Generation
We present our experience in automatically deriving a detailed test case plan exclusively using the UML diagrams developed during the analysis and design phases. We consider in pa...
Francesca Basanieri, Pierpaolo Iani, Gaetano Lomba...
ICARIS
2007
Springer
14 years 1 months ago
Immune and Evolutionary Approaches to Software Mutation Testing
We present an Immune Inspired Algorithm, based on CLONALG, for software test data evolution. Generated tests are evaluated using the mutation testing adequacy criteria, and used to...
Peter May, Jon Timmis, Keith Mander
CORR
2011
Springer
189views Education» more  CORR 2011»
13 years 2 months ago
A Factorial Experiment on Scalability of Search Based Software Testing
Software testing is an expensive process, which is vital in the industry. Construction of the test-data in software testing requires the major cost and to decide which method to us...
Arash Mehrmand, Robert Feldt
ICES
2010
Springer
106views Hardware» more  ICES 2010»
13 years 5 months ago
The Use of Genetic Algorithm to Reduce Power Consumption during Test Application
Abstract. In this paper it is demonstrated how two issues from the area of testing electronic components can be merged and solved by means of a genetic algorithm. The two issues ar...
Jaroslav Skarvada, Zdenek Kotásek, Josef St...