399 search results - page 8 / 80 » Using genetic algorithms to generate test plans for function... |
KBSE
2007
IEEE
14 years 2 months ago
2007
IEEE
Randomized testing has been shown to be an effective method for testing software units. However, the thoroughness of randomized unit testing varies widely according to the settin...
PTS
2008
13 years 9 months ago
2008
The state space explosion due to concurrency and timing constraints of concurrent real-time systems (CRTS) presents significant challenges to the verification engineers. In this pa...
VTS
1996
IEEE
13 years 12 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
DATE
1999
IEEE
14 years 2 days ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
CEC
2009
IEEE
14 years 2 months ago
2009
IEEE
— In this paper, the performance assessment of the hybrid Archive-based Micro Genetic Algorithm (AMGA) on a set of bound-constrained synthetic test problems is reported. The hybr...