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SSDBM
2003
IEEE
101views Database» more  SSDBM 2003»
14 years 1 months ago
Disclosure Risk Measures for Microdata
In this paper, we define several disclosure risk measures for microdata. We will analyze disclosure risk based on the disclosure control techniques applied to initial microdata. D...
Traian Marius Truta, Farshad Fotouhi, Daniel C. Ba...
ITC
1997
IEEE
107views Hardware» more  ITC 1997»
13 years 12 months ago
On-Chip Measurement of the Jitter Transfer Function of Charge-Pump Phase-Locked Loops
- An all-digital technique for the measurement of the jitter transfer function of charge-pump phase-locked loops is introduced. Input jitter may be generated using one of two metho...
Benoît R. Veillette, Gordon W. Roberts
SIGGRAPH
1992
ACM
13 years 11 months ago
Measuring and modeling anisotropic reflection
A new device for measuringthe spatial reflectancedistributionsof surfaces is introduced, along with a new mathematical model of sniaorropic reflectance. The reflectance model pres...
Gregory J. Ward
ACL
2003
13 years 9 months ago
Reliable Measures for Aligning Japanese-English News Articles and Sentences
We have aligned Japanese and English news articles and sentences to make a large parallel corpus. We first used a method based on cross-language information retrieval (CLIR) to a...
Masao Utiyama, Hitoshi Isahara
INTERACT
2003
13 years 9 months ago
Attention Tracking - Measuring the Focus of Attention
: As in advertising, online information works best if the users instantly realize the message conveyed. There is no easy to use and valid method for measuring what the viewers actu...
Christopher Mueller, Andy Disler, Daniel Felix