The products of systems cannot always be judged at face value: the process by which they were obtained is also important. For instance, the rigour of a scientific experiment, the e...
Simon Miles, Paul T. Groth, Steve Munroe, Michael ...
Metric distances and the more general concept of dissimilarities are widely used tools in instance-based learning methods and very especially in the nearestneighbor classification...
Data reliability has been drawn much concern in large-scale data warehouses with 1PB or more data. It highly depends on many inter-dependent system parameters, such as the replica ...
Kai Du, Zhengbing Hu, Huaimin Wang, Yingwen Chen, ...
In this paper we study the performance improvements and trade-offs derived from an optimized mapping approach applied on a parametric coarse grained reconfigurable array architect...
Grigoris Dimitroulakos, Michalis D. Galanis, Const...
This paper describes the process planning techniques we developed for use in an Integrated Product and Process Design (IPPD) tool for the design and manufacture of microwave trans...
Dana S. Nau, Michael O. Ball, John S. Baras, Abdur...