100 search results - page 11 / 20 » Valuing IT through Virtual Process Measurement |
JCP
2008
13 years 7 months ago
2008
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
TSP
2008
13 years 7 months ago
2008
The problem of optimal node density maximizing the Neyman-Pearson detection error exponent subject to a constraint on average (per node) energy consumption is analyzed. The spatial...
HAPTICS
2006
IEEE
14 years 1 months ago
2006
IEEE
The design of usable haptic icons (brief informational signals delivered through the sense of touch) requires a tool for measuring perceptual distances between icons that will be ...
EUROPAR
2005
Springer
14 years 1 months ago
2005
Springer
Abstract. We present PerfMiner, a system for the transparent collection, storage and presentation of thread-level hardware performance data across an entire cluster. Every sub-proc...
ICIP
2006
IEEE
14 years 9 months ago
2006
IEEE
In the current video analysis scenario, effective clustering of shots facilitates the access to the content and helps in understanding the associated semantics. This paper introdu...