717 search results - page 27 / 144 » Virtual Circuit Switching |
TCAD
2002
13 years 7 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
ISLPED
1997
ACM
13 years 12 months ago
1997
ACM
Communications satellites use steerable antenna arrays for their communication links. These arrays need multi channel signal routing circuits up to several tens of channels. Tradi...
ET
2010
13 years 5 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
ASPDAC
2001
ACM
13 years 11 months ago
2001
ACM
- This paper presents encoding techniques to optimize the switching activity on a multiplexed DRAM address bus. The DRAM switching activity can be classified either as external (be...
ONDM
2007
13 years 9 months ago
2007
WDM technology has increased network link capacity dramatically, moving the network bottleneck from the transport to the routing layer. Hybrid electro-optical architectures seem at...