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ASPDAC
2008
ACM
103views Hardware» more  ASPDAC 2008»
13 years 9 months ago
Reliability-aware design for nanometer-scale devices
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...
David Atienza, Giovanni De Micheli, Luca Benini, J...
IRI
2006
IEEE
14 years 1 months ago
Provide relevant knowledge to specify product design project needs
1 In many of today’s industry, knowledge is considered a strategic tool; however, knowledge is involved in so many services with so many facets that it is very complex to effecti...
Fabrice Alizon, Steven B. Shooter, Timothy W. Simp...
AUTOMATICA
2006
101views more  AUTOMATICA 2006»
13 years 7 months ago
A risk-sensitive approach to total productive maintenance
While risk-sensitive (RS) approaches for designing plans of total productive maintenance are critical in manufacturing systems, there is little in the literature by way of theoret...
Abhijit Gosavi
WSC
2007
13 years 10 months ago
Reusable tool for 300mm intrabay AMHS modeling and simulation
The transition to 300mm wafer size introduced a lot of new technologies to wafer fabrication facilities that mandated the presence of intrabay automated material handling systems ...
Ahmed El-Nashar, Khaled S. El-Kilany
CAISE
2003
Springer
14 years 25 days ago
Virtual Communities: Analysis and Design Support
Abstract. Information systems engineering for design or knowledge communities is characterized by the fact that these communities constantly monitor themselves and initiate repair ...
Ralf Klamma, Marc Spaniol, Matthias Jarke