1440 search results - page 171 / 288 » Warped Gaussian Processes |
234
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CCECE
2011
IEEE
14 years 4 months ago
2011
IEEE
Models for the local anodic oxidation of silicon using scanning tunneling microscopy and non-contact atomic force microscopy are implemented in a generic process simulator, using ...
152
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ICPR
2010
IEEE
15 years 8 months ago
2010
IEEE
—In Dirichlet process (DP) mixture models, the number of components is implicitly determined by the sampling parameters of Dirichlet process. However, this kind of models usually...
176
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ICCV
2011
IEEE
14 years 4 months ago
2011
IEEE
Learning good image priors is of utmost importance for the study of vision, computer vision and image processing applications. Learning priors and optimizing over whole images can...
202
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ICCV
2007
IEEE
16 years 12 months ago
2007
IEEE
This paper presents a component based deformable
model for generalized face alignment, in which a novel bistage
statistical framework is proposed to account for both
local and g...
124
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ICML
2000
IEEE
16 years 5 months ago
2000
IEEE
This paper describes Pairwise Bisection: a nonparametric approach to optimizing a noisy function with few function evaluations. The algorithm uses nonparametric reasoning about si...