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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
14 years 1 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
AINA
2006
IEEE
14 years 3 months ago
Collaborative Fault Diagnosis in Grids through Automated Tests
Grids have the potential to revolutionize computing by providing ubiquitous, on demand access to computational services and resources. However, grid systems are extremely large, c...
Alexandre Duarte, Francisco Vilar Brasileiro, Walf...
VRML
1998
ACM
14 years 1 months ago
VRML in Architectural Construction Documents: A Case Study
The Virtual Reality Modeling Language (VRML) and the World Wide Web (WWW) offer new opportunities to communicate an architect’s design intent throughout the design process. We h...
Dace A. Campbell
HPCA
1997
IEEE
14 years 1 months ago
ATM and Fast Ethernet Network Interfaces for User-Level Communication
Fast Ethernet and ATM are two attractive network technologies for interconnecting workstation clusters for parallel and distributed computing. This paper compares network interfac...
Matt Welsh, Anindya Basu, Thorsten von Eicken
CAD
2005
Springer
13 years 9 months ago
Computer-aided characterization for effective mechanical properties of porous tissue scaffolds
Performance of various functions of the tissue structure depends on porous scaffold microstructures with specific porosity characteristics that influence the behavior of the incor...
Zhibin Fang, Binil Starly, Wei Sun