63 search results - page 10 / 13 » Wrapper design for embedded core test |
DAC
1997
ACM
13 years 11 months ago
1997
ACM
Novel test bench techniques are required to cope with a functional test complexity which is predicted to grow much more strongly than design complexity. Our test bench approach at...
GECCO
2005
Springer
14 years 1 months ago
2005
Springer
Because of the large number of possible combinations for the fuel assembly loading in the core, the design of the loading pattern (LP) is a complex optimization problem. It requir...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
FPGA
2006
ACM
13 years 11 months ago
2006
ACM
Embedded memory blocks are important resources in contemporary FPGA devices. When targeting FPGAs, application designers often specify high-level memory functions which exhibit a ...
ATS
2001
IEEE
13 years 11 months ago
2001
IEEE
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...