7 search results - page 2 / 2 » ats 1997 |
ATS
1997
IEEE
13 years 11 months ago
1997
IEEE
This paper considers the testability implications of low power design methodologies. Low power and high testability are shown to be highly contrasting requirements, and an optimiz...
ATS
1997
IEEE
13 years 11 months ago
1997
IEEE
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...