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ATS
2001
IEEE
14 years 1 months ago
2001
IEEE
Test access is a major problem for core-based systemon-chip (SOC) designs. Since cores in an SOC are not directly accessible via chip inputs and outputs, special access mechanisms...
ATS
2001
IEEE
14 years 1 months ago
2001
IEEE
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...