Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...
Erika Gunadi, Abhishek A. Sinkar, Nam Sung Kim, Mi...
Abstract. We pose the problem of determining the rate of convergence at which AdaBoost minimizes exponential loss. Boosting is the problem of combining many "weak," high-...