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DT
2008
63views more  DT 2008»
15 years 3 months ago
Defect Tolerance for Nanoscale Crossbar-Based Devices
Mohammad Tehranipoor, Reza M. Rad
80
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DT
2008
62views more  DT 2008»
15 years 3 months ago
UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting
Chao-Wen Tzeng, Shi-Yu Huang
DT
2008
49views more  DT 2008»
15 years 3 months ago
A Quality-Driven Design Approach for NoCs
Stephan Bourduas, Jean-Samuel Chenard, Zeljko Zili...
92
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DT
2008
50views more  DT 2008»
15 years 3 months ago
A Digital-Microfluidic Approach to Chip Cooling
Philip Y. Paik, Vamsee K. Pamula, Krishnendu Chakr...