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48
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dt 2008
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Defect Tolerance for Nanoscale Crossbar-Based Devices
15 years 3 months ago
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www.engr.uconn.edu
Mohammad Tehranipoor, Reza M. Rad
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Challenges and Solutions for Late- and Post-Silicon Design
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bwrc.eecs.berkeley.edu
Jan M. Rabaey, Sharad Malik
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UMC-Scan Test Methodology: Exploiting the Maximum Freedom of Multicasting
15 years 3 months ago
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larc.ee.nthu.edu.tw
Chao-Wen Tzeng, Shi-Yu Huang
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A Quality-Driven Design Approach for NoCs
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www.iml.ece.mcgill.ca
Stephan Bourduas, Jean-Samuel Chenard, Zeljko Zili...
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A Digital-Microfluidic Approach to Chip Cooling
15 years 3 months ago
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people.ee.duke.edu
Philip Y. Paik, Vamsee K. Pamula, Krishnendu Chakr...
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