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dt 2010
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Automated Source-Level Error Localization in Hardware Designs
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Bernhard Peischl, Franz Wotawa
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Optical Contactless Probing: An All-Silicon, Fully Optical Approach
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Selahattin Sayil
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Survey of Test Vector Compression Techniques
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Nur A. Touba
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Making a List...Checking it Twice
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Grant Martin
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Guest Editors' Introduction: Security and Trust in Embedded-Systems Design
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Patrick Schaumont, Anand Raghunathan
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