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ICCAD
2006
IEEE
14 years 7 months ago
2006
IEEE
Statistical Static Timing Analysis has received wide attention recently and emerged as a viable technique for manufacturability analysis. To be useful, however, it is important th...
ICCAD
2006
IEEE
14 years 7 months ago
2006
IEEE
In this work we propose a methodology to self-consistently solve leakage power with temperature to predict thermal runaway. We target 28nm FinFET based circuits as they are more p...
ICCAD
2006
IEEE
14 years 7 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
ICCAD
2006
IEEE
14 years 7 months ago
2006
IEEE
This paper examines how circuits and systems made from molecular QCA devices might function. Our design constraints are “chemically reasonable” in that we consider the charact...
ICCAD
2006
IEEE
14 years 7 months ago
2006
IEEE
Most existing RCL−1 circuit reductions stamp inverse inductance L−1 elements by a second-order nodal analysis (NA). The NA formulation uses nodal voltage variables and describ...