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ICCAD
2007
IEEE
14 years 7 months ago
2007
IEEE
Late CMOS scaling reduces device reliability, and existing work has studied the permanent SER (soft error rate) for configuration memory in FPGA extensively. In this paper, we sh...
ICCAD
2007
IEEE
14 years 7 months ago
2007
IEEE
—As the 193nm lithography is likely to be used for 45nm and even 32nm processes, much more stringent requirement will be posed on Optical Proximity Correction (OPC) technologies....
ICCAD
2007
IEEE
14 years 7 months ago
2007
IEEE
—In the VLSI design process, a design implementation often needs to be corrected because of new specifications or design constraint violations. This correction process is referre...
ICCAD
2007
IEEE
14 years 7 months ago
2007
IEEE
Abstract— Nanoscale technology promises dramatically increased device density, but also decreased reliability. With bit error rates projected to be as high as 10%, designing a us...
ICCAD
2007
IEEE
14 years 7 months ago
2007
IEEE
Modern IC designs have reached unparalleled levels of complexity, resulting in more and more bugs discovered after design tape-out However, so far only very few EDA tools for post...