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ISQED
2011
IEEE
13 years 2 months ago
2011
IEEE
The extent to which the 6T SRAM bit cell can be perpetuated through continued scaling is of enormous technological and economic importance. Understanding the growing limitations i...
ISQED
2011
IEEE
13 years 2 months ago
2011
IEEE
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
ISQED
2011
IEEE
13 years 1 months ago
2011
IEEE
—Design optimization methodologies for AMS-SoCs with analog, digital, and mixed-signal portions have not received significant attention, due to their high complexity. In mixed-s...
ISQED
2011
IEEE
13 years 2 months ago
2011
IEEE
Due to the dramatic increase in design complexity, verifying the functional correctness of a circuit is becoming more difficult. Therefore, bugs may escape all verification effo...
ISQED
2011
IEEE
13 years 2 months ago
2011
IEEE
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...