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ITC
1994
IEEE
15 years 10 months ago
1994
IEEE
: The IC test industry has struggled .for more than 30years to establish a test approach that would guarantee a low defect level to the customer. Wepropose a comprehensive strategy...
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ITC
1994
IEEE
15 years 10 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...