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JCP
2008
13 years 7 months ago
2008
A huge application domain, in particular, wireless and handheld devices strongly requires flexible and powerefficient hardware with high performance. This can only be achieved with...
JCP
2008
13 years 7 months ago
2008
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
JCP
2008
13 years 7 months ago
2008
To build a cooperative logistics network covering multiple enterprises, a planning method that can build a long-distance transportation network is required. Many strict constraints...
JCP
2008
13 years 7 months ago
2008
Data reliability has been drawn much concern in large-scale data warehouses with 1PB or more data. It highly depends on many inter-dependent system parameters, such as the replica ...
JCP
2008
13 years 7 months ago
2008
Fault detection in large-scale systems is conducted by the use of sensors, thus the sensor location influences the performances of fault detection directly. As the scale of systems...