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MR
2002
13 years 10 months ago
2002
MR
2002
13 years 10 months ago
2002
MR
2002
13 years 10 months ago
2002
This paper reviews the main failure mechanisms occurring in modern power modules paying special attention to insulated gate bipolar transistor devices for high-power applications....
MR
2002
13 years 10 months ago
2002
ESD protection design for CMOS RF integrated circuits is proposed in this paper by using the stacked polysilicon diodes as the input ESD protection devices to reduce the total inp...
MR
2002
13 years 10 months ago
2002
This paper presents an approach to the analysis of transient thermal states in electronic circuits using an analytical solution of the heat equation. Fully three-dimensional analy...