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TCAD
2010
150views more  TCAD 2010»
13 years 5 months ago
Voltage and Temperature Aware Statistical Leakage Analysis Framework Using Artificial Neural Networks
Artificial neural networks (ANNs) have shown great promise in modeling circuit parameters for computer aided design applications. Leakage currents, which depend on process paramete...
Janakiraman Viraraghavan, Bharadwaj Amrutur, V. Vi...
TCAD
2010
88views more  TCAD 2010»
13 years 5 months ago
Stress Aware Layout Optimization Leveraging Active Area Dependent Mobility Enhancement
Starting from the 90nm technology node, process induced stress has played a key role in the design of highperformance devices. The emergence of source/drain silicon germanium (S/D ...
Ashutosh Chakraborty, Sean X. Shi, David Z. Pan
TCAD
2010
136views more  TCAD 2010»
13 years 5 months ago
Bounded Model Debugging
Design debugging is a major bottleneck in modern VLSI design flows as both the design size and the length of the error trace contribute to its inherent complexity. With typical des...
Brian Keng, Sean Safarpour, Andreas G. Veneris
TCOM
2010
114views more  TCOM 2010»
13 years 5 months ago
Achieving near-capacity performance on multiple-antenna channels with a simple concatenation scheme
This paper proposes a capacity-approaching, yet simple scheme for multi-input multiple-output (MIMO) channels. The proposed scheme is based on a concatenation of a mixture of short...
Nghi H. Tran, Tho Le-Ngoc, Tad Matsumoto, Ha H. Ng...
BIB
2010
140views more  BIB 2010»
13 years 7 months ago
Next generation sequencing in functional genomics
Genome-wide sequencing has enabled modern biomedical research to relate more and more events in healthy as well as disease-affected cells and tissues to the genomic sequence. Now ...
Thomas Werner