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EVOW
2008
Springer
13 years 10 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
IPPS
2008
IEEE
14 years 3 months ago
2008
IEEE
Given the complexity of parallel programs, developers often must rely on performance analysis tools to help them improve the performance of their code. While many tools support th...
MICCAI
2008
Springer
14 years 10 months ago
2008
Springer
Abstract. Structural imaging investigations commonly apply a segmentation step followed by the extraction of feature data that can be used to compare or discriminate groups. We pre...
CIMCA
2008
IEEE
14 years 3 months ago
2008
IEEE
Heart disease continues to be leading cause of morbidity and mortality among adults all over the world. Cardiac risk factor assessment requires a classification system that is rob...
HICSS
2008
IEEE
14 years 3 months ago
2008
IEEE
The European Commission, through its Framework Programme aims to stimulate the development of sustained collaborative research networks across Europe. Social network analysis (SNA...