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    Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy
    13 years 11 months ago
    Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy
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    Abstract--Due to the limited depth of field of brightfield microscopes, it is usually impossible to image thick specimens entirely in focus. By optically sectioning the specimen, t...
    François Aguet, Dimitri Van De Ville, Micha...
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