ICANN
2003
Springer
14 years 20 days ago
2003
Springer
Pattern recognition problems span a broad range of applications, where each application has its own tolerance on classification error. The varying levels of risk associated with ma...
IBPRIA
2003
Springer
14 years 20 days ago
2003
Springer
Abstract. This paper is a review of works about the use of the logpolar image model for pattern recognition purposes. Particular attention is paid to the rotation- and scale-invari...
DAGM
2003
Springer
14 years 20 days ago
2003
Springer
We provide an overview of spline and wavelet techniques with an emphasis on applications in pattern recognition. The presentation is divided in three parts. In the first one, we ar...
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Homepage SSPR
2004
Springer
14 years 24 days ago
2004
Springer
Abstract. It is difficult to track, parse and model human-computer interactions during editing and revising of documents, but it is necessary if we are to develop automated technol...
SSPR
2004
Springer
14 years 24 days ago
2004
Springer
SSPR
2004
Springer
14 years 24 days ago
2004
Springer
High-resolution spectroscopy is a powerful industrial tool. The number of features (wavelengths) in these data sets varies from several hundreds up to a thousand. Relevant feature ...
SSPR
2004
Springer
14 years 24 days ago
2004
Springer
The integrated approach is a classifier established on statistical estimator and artificial neural network. This consists of preliminary data whitening transformation which provide...
SSPR
2004
Springer
14 years 24 days ago
2004
Springer
This paper presents an optimized Hill Climbing algorithm to select a subset of features for handwritten character recognition. The search is conducted taking into account a random ...
SSPR
2004
Springer
14 years 24 days ago
2004
Springer
