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    Test Consideration for Nanometer-Scale CMOS Circuits
    13 years 11 months ago
    Test Consideration for Nanometer-Scale CMOS Circuits
    Download  cadlab.ece.ucsb.edu
    The ITRS (International Technology Roadmap for Semiconductors) predicts aggressive scaling down of device size, transistor threshold voltage and oxide thickness to meet growing de...
    Kaushik Roy, T. M. Mak, Kwang-Ting (Tim) Cheng
    claim paper
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