Sciweavers

ISVLSI
2007
IEEE
116views VLSI» more  ISVLSI 2007»
14 years 5 months ago
Impact of Process Variations on Carbon Nanotube Bundle Interconnect for Future FPGA Architectures
As CMOS technology continues to scale, copper interconnect (CuI) will hinder the performance and reliability of Field Programmable Gate Arrays (FPGA) motivating the need for alter...
Soumya Eachempati, Narayanan Vijaykrishnan, Arthur...