ITC
1993
IEEE
13 years 11 months ago
1993
IEEE
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
ISCAS
2003
IEEE
14 years 11 days ago
2003
IEEE
SystemC will become more and more important for the design of digital circuits from the specification down to the RT-Level. Complex systems often contain analog components. This p...
ICC
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— Nowadays a lot of effort is spent on developing OFDMbased inexpensive wireless transceivers. Direct-conversion radio frequency transceivers are appealing because they a...