CCECE
2011
IEEE
13 years 12 days ago
2011
IEEE
Models for the local anodic oxidation of silicon using scanning tunneling microscopy and non-contact atomic force microscopy are implemented in a generic process simulator, using ...
ICASSP
2011
IEEE
13 years 4 months ago
2011
IEEE
In this paper we describe a method for detection and measurement of elliptical particles in atomic force microscopy (AFM) images. AFM imaging is used in physics to scan surfaces; ...
ICIP
2008
IEEE
15 years 2 months ago
2008
IEEE
In this paper, an automated algorithm to flatten lines from Atomic Force Microscopy (AFM) images is presented. Due to the mechanics of the AFM, there is a curvature distortion (bo...