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ATS
1999
IEEE

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An Embedded Core DFT Scheme to Obtain Highly Compressed Test Sets

15 years 8 months ago

An Embedded Core DFT Scheme to Obtain Highly Compressed Test Sets

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Abhijit Jas, Kartik Mohanram, Nur A. Touba

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92

ATS
1999
IEEE

103views Hardware» more ATS 1999»

Defining SRAM Resistive Defects and Their Simulation Stimuli

15 years 8 months ago

Defining SRAM Resistive Defects and Their Simulation Stimuli

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A. J. van de Goor, J. E. Simonse

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