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    ATS
    1999
    IEEE
    99views Hardware» more  ATS 1999»
    An Embedded Core DFT Scheme to Obtain Highly Compressed Test Sets
    14 years 25 days ago
    An Embedded Core DFT Scheme to Obtain Highly Compressed Test Sets
    Download  cadal.cse.nsysu.edu.tw
    Abhijit Jas, Kartik Mohanram, Nur A. Touba
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    ATS
    1999
    IEEE
    103views Hardware» more  ATS 1999»
    Defining SRAM Resistive Defects and Their Simulation Stimuli
    14 years 25 days ago
    Defining SRAM Resistive Defects and Their Simulation Stimuli
    Download  ce.et.tudelft.nl
    A. J. van de Goor, J. E. Simonse
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