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MR
2006
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MR 2006
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Single event burnout in power diodes: Mechanisms and models
14 years 1 days ago
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tplab.vuse.vanderbilt.edu
Power electronic devices are susceptible to catastrophic failures when they are exposed to energetic particles; the most serious failure mechanism is single event burnout (SEB). S...
A. M. Albadri, Ronald D. Schrimpf, Kenneth F. Gall...
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