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    Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits
    13 years 12 months ago
    Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits
    Download  www.ics.ee.nctu.edu.tw
    CDM ESD event has become the main ESD reliability concern for integrated-circuits products using nanoscale CMOS technology. A novel CDM ESD protection design, using self-biased cu...
    Shih-Hung Chen, Ming-Dou Ker
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