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    DAC
    2009
    ACM
    133views Computer Architecture» more  DAC 2009»
    Statistical reliability analysis under process variation and aging effects
    15 years 16 days ago
    Statistical reliability analysis under process variation and aging effects
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    Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
    Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
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