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39
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VTC
2007
IEEE
109
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Communications
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VTC 2007
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A Reliability-Aware LDPC Code Decoding Algorithm
14 years 5 months ago
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ems.eit.uni-kl.de
— With the continuing downscaling of microelectronic technology, chip reliability becomes a great threat to the design of future complex microelectronic systems. Hence increasing...
Matthias Alles, Torben Brack, Norbert Wehn
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