Sciweavers

ETS
2010
IEEE
150views Hardware» more  ETS 2010»
13 years 10 months ago
Predicting dynamic specifications of ADCs with a low-quality digital input signal
— A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A noisy and nonlinear pulse is applied as the test stimulus, which is suitable for...
Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff