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ETS
2010
IEEE
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ETS 2010
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Predicting dynamic specifications of ADCs with a low-quality digital input signal
13 years 10 months ago
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eprints.eemcs.utwente.nl
— A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A noisy and nonlinear pulse is applied as the test stimulus, which is suitable for...
Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff
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