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    ASPDAC
    2005
    ACM
    123views Hardware» more  ASPDAC 2005»
    Yield driven gate sizing for coupling-noise reduction under uncertainty
    13 years 9 months ago
    Yield driven gate sizing for coupling-noise reduction under uncertainty
    Download  users.eecs.northwestern.edu
    Abstract— This paper presents a post-route gate-sizing algorithm for coupling-noise reduction that constrains the yield loss under process variations. Algorithms for coupling-noi...
    Debjit Sinha, Hai Zhou
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