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33
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ICCAD
2006
IEEE
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ICCAD 2006
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Exploring linear structures of critical path delay faults to reduce test efforts
14 years 8 months ago
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www.cecs.uci.edu
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...
Shun-Yen Lu, Pei-Ying Hsieh, Jing-Jia Liou
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