ASPDAC
2008
ACM
14 years 1 months ago
2008
ACM
In nanometer regime, IC designs have to consider the impact of process variations, which is often indicated by manufacturing/parametric yield. This paper investigates a yield model...
MICCAI
2009
Springer
15 years 19 days ago
2009
Springer
Abstract. We present a method for automatically segmenting skin lesions by initializing the random walker algorithm with seed points whose properties, such as colour and texture, h...