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ET
2002
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ET 2002
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Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
14 years 12 days ago
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poisson.usc.edu
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer
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