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MICRO
2010
IEEE
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MICRO 2010
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Combating Aging with the Colt Duty Cycle Equalizer
13 years 9 months ago
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www.ece.wisc.edu
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...
Erika Gunadi, Abhishek A. Sinkar, Nam Sung Kim, Mi...
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