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    1998
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    Scalable Test Generators for High-Speed Datapath Circuits
    13 years 11 months ago
    Scalable Test Generators for High-Speed Datapath Circuits
    Download  www.ece.ucdavis.edu
    This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
    Hussain Al-Asaad, John P. Hayes, Brian T. Murray
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