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    ICIP
    1998
    IEEE
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    EXM Eigen Templates for Detecting and Classifying Arbitrary Junctions
    15 years 1 months ago
    EXM Eigen Templates for Detecting and Classifying Arbitrary Junctions
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    A novel method for extracting parametric junction and corner features in images is presented. By treating each complex feature as a combination of elementary line and edge feature...
    Dibyendu Nandy, Jezekiel Ben-Arie
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