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34
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DFT
2004
IEEE
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VLSI
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DFT 2004
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Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes
14 years 3 months ago
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test.ict.ac.cn
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n1, m, 3) convolutional...
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman ...
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