Sciweavers
Explore
Publications
Books
Software
Tutorials
Presentations
Lectures Notes
Datasets
Labs
Conferences
Community
Upcoming
Conferences
Top Ranked Papers
Most Viewed Conferences
Conferences by Acronym
Conferences by Subject
Conferences by Year
Tools
Sci2ools
International Keyboard
Graphical Social Symbols
CSS3 Style Generator
OCR
Web Page to Image
Web Page to PDF
Merge PDF
Split PDF
Latex Equation Editor
Extract Images from PDF
Convert JPEG to PS
Convert Latex to Word
Convert Word to PDF
Image Converter
PDF Converter
Community
Sciweavers
About
Terms of Use
Privacy Policy
Cookies
40
click to vote
SMI
1999
IEEE
108
views
Image Analysis
»
more
SMI 1999
»
Modeling of Surfaces with Fair Reflection Line Pattern
14 years 4 months ago
Download
mrl.nyu.edu
Inspection of reflection line patterns is a standard way to check the quality of free form surfaces. In this paper, we describe an approach which enables the designer to control d...
Joachim Loos, Günther Greiner, Hans-Peter Sei...
claim paper
Read More »