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    VLSID
    2007
    IEEE
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    Soft Error Rate Analysis for Combinational Logic Using An Accurate Electrical Masking Model
    15 years 25 days ago
    Soft Error Rate Analysis for Combinational Logic Using An Accurate Electrical Masking Model
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    Accurate electrical masking modeling represents a significant challenge in soft error rate analysis for combinational logic circuits. In this paper, we use table lookup MOSFET mode...
    Feng Wang 0004, Yuan Xie, R. Rajaraman, Balaji Vai...
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