ET 1998 | Sciweavers

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ET
1998

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A Behavior Model for Next Generation Test Systems

13 years 11 months ago

Deﬁning information required by automatic test systems frequently involves a description of system behavior. To facilitate capturing the required behavior information in the cont...

Lee A. Shombert, John W. Sheppard

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31

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ET
1998

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Initialization of Sequential Circuits and its Application to ATPG

13 years 11 months ago

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Jalal A. Wehbeh, Daniel G. Saab

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31

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ET
1998

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Scalable Test Generators for High-Speed Datapath Circuits

13 years 11 months ago

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This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...

Hussain Al-Asaad, John P. Hayes, Brian T. Murray

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39

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ET
1998

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Design of Self-Testing Checkers for m-out-of-n Codes Using Parallel Counters

13 years 11 months ago

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This paper extends the design method of self-testing checkers (STCs) for some m-out-of-n (m/n) codes, proposed recently in IEEE Trans. Comput., 1995 by Dimakopoulos et al. The chec...

Stanislaw J. Piestrak

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